DOUBLE BEAM ION SOURCE FOR AN IRMS INSTRUMENT

A. Pamula, M. Leuca, Adriana Dehelean, I. Dobocan

National Institute for Research and Development of Isotopic and Molecular Technologies, P.O.Box 700, 71 – 103 Donath Str., 400293 Cluj-Napoca, Romania

The objective of the present paper is the design of an electron impact ion source, capable to supply two identical and symmetrical ion beams, which could be separately and simultaneously analyzed by two identical mass filters. This setup would lead to a new high precision IRMS instrument.
The ion optical problem was solved by numerical simulation. SIMION 3D, version 7.0 software was used to perform the simulation. The main electrical, ion-optical and mechanical parameters were determined. Figure. 1 shows a 3D view of the computer modeling.

Figure 1. 3D view of the ion source. The electronic and ionic beams are visible.